I have a 300G Western Digital Raptor, recently showing UNC SMART, wondering anyone who has experience knows should I replace it and get warranty form WD?
Details of smartctl -a as follows:
smartctl 5.41 2011-06-09 r3365 [FreeBSD 8.2-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital VelociRaptor
Device Model: WDC WD3000HLFS-01G6U0
Serial Number: WD-WXD0C79C8807
LU WWN Device Id: 5 0014ee 0ac3cfaf0
Firmware Version: 04.04V01
User Capacity: 300,069,052,416 bytes [300 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Apr 19 16:03:33 2012 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 59) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 195 195 051 Pre-fail Always - 49036
3 Spin_Up_Time 0x0003 199 196 021 Pre-fail Always - 3008
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 425
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 086 086 000 Old_age Always - 10292
10 Spin_Retry_Count 0x0012 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 404
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 268
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 426
194 Temperature_Celsius 0x0022 117 100 000 Old_age Always - 30
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 4
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 1
SMART Error Log Version: 1
ATA Error Count: 749 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 749 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 40 10 a6 4e 58 01 08 00:16:23.812 READ FPDMA QUEUED
60 08 10 9e 32 5b 00 08 00:16:17.646 READ FPDMA QUEUED
60 08 10 9e 32 5b 00 08 00:16:17.645 READ FPDMA QUEUED
ef 02 00 00 00 00 00 08 00:16:17.645 SET FEATURES [Enable write cache]
60 08 10 9e 32 5b 00 08 00:16:11.412 READ FPDMA QUEUED
Error 748 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 10 9e 32 5b 00 08 00:16:11.412 READ FPDMA QUEUED
60 08 10 9e 32 5b 00 08 00:16:11.412 READ FPDMA QUEUED
ef 02 00 00 00 00 00 08 00:16:11.412 SET FEATURES [Enable write cache]
60 00 30 1e cb 53 06 08 00:16:05.199 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.180 READ FPDMA QUEUED
Error 747 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 30 1e cb 53 06 08 00:16:05.199 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.180 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.178 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.178 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.178 READ FPDMA QUEUED
Error 746 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 30 1e cb 53 06 08 00:15:58.945 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:58.945 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:58.945 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:58.945 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:58.944 READ FPDMA QUEUED
Error 745 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 30 1e cb 53 06 08 00:15:52.727 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:52.727 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:52.727 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:52.727 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:52.726 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Do the replace if you can.
On the other hand these are 'only' read errors which is not that bad. If you write to that sector then you can be only sure if it has defects.
I would run the vendors utility to check (they also run smart tests) if it has problems. They usually make bootable cds available.
You can and should run a self test which you can do from linux by issuing
wait a couple of hours (it will show an estimate). Then check again with
If it says
Completed without errorsyou are fine. If not go for the vendors utility to check the drive.Read errors can be caused by something as simple as losing power during a write operation. Alone, they don't suggest any hardware issues with the drive.